Informationen über Nanotechnologie
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The inset image shows the simultaneously collected AFM image and Raman data from a SiO2/Si pattern, collected using the Nanonics NSOM/AFM 100 Confocal™/Renishaw Raman microscope system, depicting a Raman resolution of approximately 250nm. This instrumentation may be also be configured to take advantage of the enhanced spatial resolution offered by Tip Enhanced Raman Spectroscopy (TERS). A TERS probe provides highly localised Raman signal enhancement in an area smaller than the normal far-field diffraction limit, allowing Raman information to be obtained at much greater spatial resolution than with conventional Raman techniques. Application note: A study of single-wall nanotubes using Renishaw's structural and chemical analyser for scanning electron microscopes Documentillustrating the use of SPM and Raman spectroscopy for studying nanotechnology devices. Examples are given of Raman-AFM and TERS (tip-enhanced-Raman-scattering). Temperature-mediated growth of single-walled carbon-nanotube intramolecular junctions (2007), Yagang Yao et al, Nature materials, 6, 283-286
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